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IEEE Journal of the Electron Devices Society


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*Average Peer Review
9 Weeks
*Competitiveness
CiteScore
5

CiteScore Rank
Subject Area Rank Percentile
Category: Engineering
Subcategory: Electrical and Electronic Engineering
295 / 970
Category: Engineering
Subcategory: Electronic, Optical and Magnetic Materials
112 / 305
Category: Engineering
Subcategory: Biotechnology
142 / 314



Country/Area of Publication
UNITED STATES
Publication Frequency
Publisher
Institute of Electrical and Electronics Engineers Inc.

ISSN
2168-6734
E-ISSN
2168-6734
Year Publication Started
0

Self-citation (2024-2025)
4.20%
Annual Article Volume
142
Gold OA Percentage
98.96%


Open Access Info
APC APC Waiver Other Charges
Yes: Check details
( USD1350; )
Yes: Check detailsNo

Journal Aim & Scope
The IEEE Journal of the Electron Devices Society (J-EDS) is an open-access, fully electronic scientific journal publishing papers ranging from fundamental to applied research that are scientifically rigorous and relevant to electron devices. The J-EDS publishes original and significant contributions relating to the theory, modelling, design, performance, and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanodevices, optoelectronics, photovoltaics, power IC's, and micro-sensors. Tutorial and review papers on these subjects are, also, published. And, occasionally special issues with a collection of papers on particular areas in more depth and breadth are, also, published. J-EDS publishes all papers that are judged to be technically valid and original.


Web of Science Quartiles
WOS Quartile: Q3

Quartiles By JIFCollectionQuartileRankPercentage
Category: ENGINEERING, ELECTRICAL & ELECTRONICSCIEQ3192/366
Quartiles By JCICollectionQuartileRankPercentage
Category: ENGINEERING, ELECTRICAL & ELECTRONICSCIEQ3185/366
*Crowdsourced data
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  • IEEE Journal of the Electron Devices Society IEEE Journal of the Electron Devices Society
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